X-ray Imaging with a Grating Interferometer

Abstract

Improved contrast in X-ray images can be obtained through phase contrast and dark-field imaging.  Of the different methods for phase contrast imaging, the recently developed grating based  interferometer is well suited for use at different X-ray sources, including a standard X-ray tube.

This presentation will cover the principles and the development of grating based X-ray interferometry. The contrast mechanisms of phase contrast and dark-field images will be explained, and experimental data recorded at a standard X-ray tube, at a synchrotron radiation facility and at the Compact Light Source will be presented.

Speaker

Martin Bech

Time and date

25th of June at 13:15